Full Description

Documents the parametrized test structures of the JESSI Reliability Test Chip (RTC) which is part of the European Mini Test Chip (ETC).

Cross References:
CENELEC Document Ref. No. R 117-001
PD 6595
CENELEC R 117-001
CENELEC R 117-005
CENELEC R 117-006
CENELEC R 117- 'Description of a Parametrized European Mini Test Chip'
CENELEC R 117- 'Data Interchange Format for Simulated and Measured Data (ISMD)'
CENELEC 'R 117- Measurement Techniques of the Reliability Test Structures of the European Mini Test Chip'
CENELEC R 117- 'Evaluation of the Reliability Test Structures of the European Mini Test Chip'

Product Details

Published: 09/15/1996 ISBN(s): 0580260372 Number of Pages: 42File Size: 1 file , 980 KB Product Code(s): 00835677, 00835677, 00835677 Note: This product is unavailable in United Kingdom