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BS PD IEC/TS 62132-9:2014
New product
BS PD IEC/TS 62132-9:2014 Integrated circuits. Measurement of electromagnetic immunity. Measurement of radiated immunity. Surface scan method
standard by BSI Group, 09/30/2014
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Full Description
Cross References:
IEC 60050
IEC 62132-1
IEC TS 61967-3
IEC 61967-6
IEC TR 61967-1-1
All current amendments available at time of purchase are included with the purchase of this document.