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Full Description
Specifies requirements for the data needed to describe the test and quality parameters of semiconductor die and gives recommendations for general industry good practice. To be read in conjunction with PD ES 59008-1:2000,PD ES 59008-3:1999
Cross References:
ES 59008-1:1999
ES 59008-2:1999
ES 59008-3:1999
ES 59008-6-1:1999
ES 59008-6-2
IEC 61360:1995
Product Details
Published: 03/15/2001 ISBN(s): 0580369722 Number of Pages: 14File Size: 1 file , 190 KB Product Code(s): 19978917, 19978917, 19978917 Note: This product is unavailable in United Kingdom