Sale! View larger

IEC 61649 Ed. 1.0 b:1997 [ Withdrawn ]

New product

IEC 61649 Ed. 1.0 b:1997 [ Withdrawn ] Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

standard by International Electrotechnical Commission, 05/16/1997

More details

$33.11

-57%

$77.00

More info

Full Description

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

Product Details

Edition: 1.0 Published: 05/16/1997 Number of Pages: 31File Size: 1 file , 150 KB