> IEC 60749-5 Ed. 1.0 b:2003 [ Withdrawn ]
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IEC 60749-5 Ed. 1.0 b:2003 [ Withdrawn ]

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IEC 60749-5 Ed. 1.0 b:2003 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

standard by International Electrotechnical Commission, 01/17/2003

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Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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Edition: 1.0 Published: 01/17/2003 Number of Pages: 13File Size: 1 file , 270 KB