Full Description

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following:
a) UUT Model;
b) Stimulus and Response;
c) Fault Dictionary;
d) Probe.

Product Details

Edition: 1.0 Published: 06/21/2012 Number of Pages: 101File Size: 1 file , 1.8 MB