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IEC 62373 Ed. 1.0 b:2006

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IEC 62373 Ed. 1.0 b:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

standard by International Electrotechnical Commission, 07/18/2006

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Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

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Edition: 1.0 Published: 07/18/2006 Number of Pages: 27File Size: 1 file , 530 KB