> IEC 60749-29 Ed. 1.0 b:2003 [ Withdrawn ]
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IEC 60749-29 Ed. 1.0 b:2003 [ Withdrawn ]

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IEC 60749-29 Ed. 1.0 b:2003 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

standard by International Electrotechnical Commission, 11/04/2003

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Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to latch-up.

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Edition: 1.0 Published: 11/04/2003 Number of Pages: 41File Size: 1 file , 920 KB