Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
Product Details
Edition: 1.0 Published: 04/30/2002 Number of Pages: 57File Size: 1 file , 2.7 MB Part of: IEC 61967-4 Ed. 1.1 b:2006