Full Description

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.

Product Details

Edition: 1.0 Published: 04/12/2002 Number of Pages: 13File Size: 1 file , 410 KB