> IEC 60749-13 Ed. 1.0 b:2002 [ Withdrawn ]
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IEC 60749-13 Ed. 1.0 b:2002 [ Withdrawn ]

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IEC 60749-13 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

standard by International Electrotechnical Commission, 04/12/2002

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Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

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Edition: 1.0 Published: 04/12/2002 Number of Pages: 9File Size: 1 file , 400 KB