> IEC 60749-4 Ed. 1.0 b:2002 [ Withdrawn ]
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IEC 60749-4 Ed. 1.0 b:2002 [ Withdrawn ]

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IEC 60749-4 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

standard by International Electrotechnical Commission, 04/12/2002

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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

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Edition: 1.0 Published: 04/12/2002 Number of Pages: 15File Size: 1 file , 510 KB