> IEC 60749-6 Ed. 1.0 b:2002 [ Withdrawn ]
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IEC 60749-6 Ed. 1.0 b:2002 [ Withdrawn ]

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IEC 60749-6 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

standard by International Electrotechnical Commission, 04/12/2002

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Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

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Edition: 1.0 Published: 04/12/2002 Number of Pages: 7File Size: 1 file , 380 KB