> IEC 60749-9 Ed. 1.0 b:2002 [ Withdrawn ]
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IEC 60749-9 Ed. 1.0 b:2002 [ Withdrawn ]

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IEC 60749-9 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

standard by International Electrotechnical Commission, 04/12/2002

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Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

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Edition: 1.0 Published: 04/12/2002 Number of Pages: 9File Size: 1 file , 410 KB