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IEC 60317-26 Amd.2 Ed. 2.0 b:2010
IEC 60317-26 Amd.2 Ed. 2.0 b:2010 Amendment 2 - Specifications for particular types of winding wires - Part 26: Polyamide-imide enamelled round copper wire, class 200 Amendment by International Electrotechnical Commission, 04/26/2010
$5.16 $12.00 -57%In Stock -
IEC 60747-1 Amd.1 Ed. 2.0 b:2010
IEC 60747-1 Amd.1 Ed. 2.0 b:2010 Amendment 1 - Semiconductor devices - Part 1: General Amendment by International Electrotechnical Commission, 05/19/2010
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IEC 60317-29 Amd.2 Ed. 1.0 b:2010
IEC 60317-29 Amd.2 Ed. 1.0 b:2010 Amendment 2 - Specifications for particular types of winding wires - Part 29: Polyester or polyesterimide overcoated with polyamide-imide enamelled rectangular copper wire, class 200 Amendment by International Electrotechnical Commission, 04/26/2010
$5.16 $12.00 -57%In Stock -
IEC 61000-4-18 Amd.1 Ed. 1.0 b:2010
IEC 61000-4-18 Amd.1 Ed. 1.0 b:2010 Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-18: Testing and measurement techniques - Damped oscillatory wave immunity test Amendment by International Electrotechnical Commission, 04/22/2010
$5.16 $12.00 -57%In Stock -
IEC 60512-24-1 Ed. 1.0 b:2010
IEC 60512-24-1 Ed. 1.0 b:2010 Connectors for electronic equipment - Tests and measurements - Part 24-1: Magnetic interference tests - Test 24a: Residual magnetism standard by International Electrotechnical Commission, 03/24/2010
$5.16 $12.00 -57%In Stock -
IEC 60745-2-19 Amd.1 Ed. 1.0 b:2010
IEC 60745-2-19 Amd.1 Ed. 1.0 b:2010 Amendment 1 - Hand-held motor-operated electric tools - Safety - Part 2-19: Particular requirements for jointers Amendment by International Electrotechnical Commission, 05/26/2010
$5.16 $12.00 -57%In Stock -
IEC 60512-21-1 Ed. 1.0 b:2010
IEC 60512-21-1 Ed. 1.0 b:2010 Connectors for electronic equipment - Tests and measurements - Part 21-1: RF resistance tests - Test 21a: RF shunt resistance standard by International Electrotechnical Commission, 06/10/2010
$5.16 $12.00 -57%In Stock -
IEC 60749-32 Amd.1 Ed. 1.0 b:2010
IEC 60749-32 Amd.1 Ed. 1.0 b:2010 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) Amendment by International Electrotechnical Commission, 07/28/2010
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IEC 60749-19 Amd.1 Ed. 1.0 b:2010
IEC 60749-19 Amd.1 Ed. 1.0 b:2010 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength Amendment by International Electrotechnical Commission, 07/28/2010
$5.16 $12.00 -57%In Stock -
IEC 60539-2 Amd.1 Ed. 1.0 b:2010
IEC 60539-2 Amd.1 Ed. 1.0 b:2010 Amendment 1 - Directly heated negative temperature coefficient thermistors - Part 2: Sectional specification - Surface mount negative temperature coefficient thermistors Amendment by International Electrotechnical Commission, 07/08/2010
$5.16 $12.00 -57%In Stock -
IEC 61162-3 Amd.1 Ed. 1.0 en:2010
IEC 61162-3 Amd.1 Ed. 1.0 en:2010 Amendment 1 - Maritime navigation and radiocommunication equipment and systems - Digital interfaces - Part 3: Serial data instrument network Amendment by International Electrotechnical Commission, 06/21/2010
$5.16 $12.00 -57%In Stock -
IEC 61347-2-12 Amd.1 Ed. 1.0 b:2010
IEC 61347-2-12 Amd.1 Ed. 1.0 b:2010 Amendment 1 - Lamp controlgear - Part 2-12: Particular requirements for d.c. or a.c. supplied electronic ballasts for discharge lamps (excluding fluorescent lamps) Amendment by International Electrotechnical Commission, 09/29/2010
$5.16 $12.00 -57%In Stock
