IEC 60335-2-2 Amd.2 Ed. 5.0 b:2006 [ Withdrawn ] Amendment 2 - Household and similar electrical appliances - Safety - Part 2-2: Particular requirements for vacuum cleaners and water-suction cleaning appliances Amendment by International Electrotechnical Commission, 07/24/2006
IEC 61580-4 Ed. 1.0 b CORR1:2006 Corrigendum 1 - Methods of measurement for waveguides - Part 4: Attenuation of waveguide and waveguide assemblies en, Corrigenda by International Electrotechnical Commission, 07/24/2006
IEC 61580 Ed. 1.0 b CORR1:2006 Corrigendum 1 - Measurement of return loss on waveguide and waveguide assemblies en, Corrigenda by International Electrotechnical Commission, 07/24/2006
IEC 61189-6 Ed. 1.0 b:2006 Test methods for electrical materials, interconnection structures and assemblies - Part 6: Test methods for materials used in manufacturing electronic assemblies standard by International Electrotechnical Commission, 07/24/2006
IEC 62271-100 Amd.2 Ed. 1.0 b:2006 [ Withdrawn ] Amendment 2 - High-voltage switchgear and controlgear - Part 100: High-voltage alternating-current circuit-breakers Amendment by International Electrotechnical Commission, 07/24/2006
IEC 62290-1 Ed. 1.0 b:2006 [ Withdrawn ] Railway applications - Urban guided transport management and command/control systems - Part 1: System principles and fundamental concepts standard by International Electrotechnical Commission, 07/24/2006
IEC 60601-2-2 Ed. 4.0 b:2006 [ Withdrawn ] Medical electrical equipment - Part 2-2: Particular requirements for the safety of high frequency surgical equipment standard by International Electrotechnical Commission, 07/19/2006
IEC 61577-1 Ed. 2.0 b:2006 Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 1: General principles standard by International Electrotechnical Commission, 07/19/2006
IEC 62373 Ed. 1.0 b:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) standard by International Electrotechnical Commission, 07/18/2006
IEC 60749-26 Ed. 2.0 b:2006 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM) standard by International Electrotechnical Commission, 07/18/2006
IEC 60749-27 Ed. 2.0 b:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) standard by International Electrotechnical Commission, 07/18/2006
IEC 60749-35 Ed. 1.0 b:2006 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components standard by International Electrotechnical Commission, 07/18/2006