IEC 60695-10-3 Ed. 1.0 b:2002 [ Withdrawn ] Fire hazard testing - Part 10-3: Abnormal heat - Mould stress relief distortion test standard by International Electrotechnical Commission, 04/30/2002
IEC 60364-5-53 Amd.1 Ed. 3.0 b:2002 Amendment 1 - Electrical installations of buildings - Part 5-53: Selection and erection of electrical equipment - Isolation, switching and control Amendment by International Electrotechnical Commission, 04/30/2002
IEC 60598-2-20 Amd.2 Ed. 2.0 b:2002 [ Withdrawn ] Amendment 2 - Luminaires Part 2: Particular requirements Section 20 : Lighting chains Amendment by International Electrotechnical Commission, 04/30/2002
IEC 60353 Amd.1 Ed. 2.0 b:2002 Amendment 1 - Line traps for a.c. power systems Amendment by International Electrotechnical Commission, 04/30/2002
IEC 60313 Ed. 3.0 b:2002 Coaxial connectors used in nuclear laboratory instrumentation standard by International Electrotechnical Commission, 04/30/2002
IEC 62246-1 Ed. 1.0 en:2002 [ Withdrawn ] Reed contact units - Part 1: Generic specification standard by International Electrotechnical Commission, 04/30/2002
IEC 61967-4 Ed. 1.0 b:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method standard by International Electrotechnical Commission, 04/30/2002
IEC 60749-11 Ed. 1.0 b:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method standard by International Electrotechnical Commission, 04/12/2002
IEC 61577-3 Ed. 1.0 b:2002 [ Withdrawn ] Radiation protection instrumentation - Radon and radon decay product measuring instruments - Part 3: Specific requirements for radon decay product measuring instruments standard by International Electrotechnical Commission, 04/12/2002
IEC 60749-13 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere standard by International Electrotechnical Commission, 04/12/2002
IEC 60749-2 Ed. 1.0 b:2002 Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure standard by International Electrotechnical Commission, 04/12/2002
IEC 60749-4 Ed. 1.0 b:2002 [ Withdrawn ] Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) standard by International Electrotechnical Commission, 04/12/2002